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Thickness dependence of optoelectronic properties in ALD grown ZnO thin films
Thickness dependence of optoelectronic properties in ALD grown ZnO thin films
Thickness dependence of optoelectronic properties in ALD grown ZnO thin films
Singh, T. (Autor:in) / Lehnen, T. (Autor:in) / Leuning, T. (Autor:in) / Sahu, D. (Autor:in) / Mathur, S. (Autor:in)
APPLIED SURFACE SCIENCE ; 289 ; 27-32
01.01.2014
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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