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    Thickness dependence of optoelectronic properties in ALD grown ZnO thin films

    New search for: Singh, T.
    New search for: Lehnen, T.
    New search for: Leuning, T.
    New search for: Sahu, D.
    New search for: Mathur, S.

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    Thickness dependence of optoelectronic properties in ALD grown ZnO thin films

    New search for: Singh, T.
    New search for: Lehnen, T.
    New search for: Leuning, T.
    New search for: Sahu, D.
    New search for: Mathur, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Thickness dependence of optoelectronic properties in ALD grown ZnO thin films

    New search for: Singh, T.
    New search for: Lehnen, T.
    New search for: Leuning, T.
    New search for: Sahu, D.
    New search for: Mathur, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Thickness dependence of optoelectronic properties in ALD grown ZnO thin films

    Contributors:

    Singh, T. (author) / Lehnen, T. (author) / Leuning, T. (author) / Sahu, D. (author) / Mathur, S. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 289 ; 27-32

    Publication date:

    2014-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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