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Residual Stress Analysis by Energy-Dispersive Synchrotron Diffraction: Concepts for High Resolution Depth Profiling in Real Space
Residual Stress Analysis by Energy-Dispersive Synchrotron Diffraction: Concepts for High Resolution Depth Profiling in Real Space
Residual Stress Analysis by Energy-Dispersive Synchrotron Diffraction: Concepts for High Resolution Depth Profiling in Real Space
Fuss, T. (author) / Meixner, M. (author) / Klaus, M. (author) / Genzel, C. (author) / Kurz, S.J.B. / Mittemeijer, E.J. / Scholtes, B.
2014-01-01
8 pages
Article (Journal)
English
DDC:
620.11
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