Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Characterization of 4H-SiC surfaces by non-destructive techniques based on capacitance voltage measurements
Characterization of 4H-SiC surfaces by non-destructive techniques based on capacitance voltage measurements
Characterization of 4H-SiC surfaces by non-destructive techniques based on capacitance voltage measurements
Mizsei, J. (Autor:in) / Czett, A. (Autor:in)
APPLIED SURFACE SCIENCE ; 301 ; 19-23
01.01.2014
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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