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    Characterization of 4H-SiC surfaces by non-destructive techniques based on capacitance voltage measurements

    New search for: Mizsei, J.
    New search for: Czett, A.

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    Characterization of 4H-SiC surfaces by non-destructive techniques based on capacitance voltage measurements

    New search for: Mizsei, J.
    New search for: Czett, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of 4H-SiC surfaces by non-destructive techniques based on capacitance voltage measurements

    New search for: Mizsei, J.
    New search for: Czett, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
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    Document information
    Title:

    Characterization of 4H-SiC surfaces by non-destructive techniques based on capacitance voltage measurements

    Contributors:

    Mizsei, J. (author) / Czett, A. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 301 ; 19-23

    Publication date:

    2014-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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