Low Frequency Noise Analysis of Monolithically Fabricated 4H-SiC CMOS Field Effect Transistors: Fid-Bau Portal

Low Frequency Noise Analysis of Monolithically Fabricated 4H-SiC CMOS Field Effect Transistors

Martin, L.C. / Chan, H.K. / Clark, D. / Ramsay, E.P. / Murphy, A.E. / Smith, D.A. / Thompson, R.F. / Young, R.A.R. / Goss, J.P. / Wright, N.G.

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Low Frequency Noise Analysis of Monolithically Fabricated 4H-SiC CMOS Field Effect Transistors

Martin, L.C. / Chan, H.K. / Clark, D. / Ramsay, E.P. / Murphy, A.E. / Smith, D.A. / Thompson, R.F. / Young, R.A.R. / Goss, J.P. / Wright, N.G.

Low Frequency Noise Analysis of Monolithically Fabricated 4H-SiC CMOS Field Effect Transistors

Martin, L.C. / Chan, H.K. / Clark, D. / Ramsay, E.P. / Murphy, A.E. / Smith, D.A. / Thompson, R.F. / Young, R.A.R. / Goss, J.P. / Wright, N.G.

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Titel:

Low Frequency Noise Analysis of Monolithically Fabricated 4H-SiC CMOS Field Effect Transistors

Beteiligte:

Martin, L.C. (Autor:in) / Chan, H.K. (Autor:in) / Clark, D. (Autor:in) / Ramsay, E.P. (Autor:in) / Murphy, A.E. (Autor:in) / Smith, D.A. (Autor:in) / Thompson, R.F. (Autor:in) / Young, R.A.R. (Autor:in) / Goss, J.P. (Autor:in) / Wright, N.G. (Autor:in)

Erschienen in:

Silicon Carbide and Related Materials 2013 PART 1 Selected, peer reviewed papers from the 15^t^h International Conference on Silicon Carbide and Related Materials, (ICSCRM 2013), September 29 - October 4, 2013, Miyazaki, Japan ; 428-431

MATERIALS SCIENCE FORUM ; 778/780

Erscheinungsdatum:

01.01.2014

Format / Umfang:

4 pages

ISSN:

0255-5476

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.11

Martin, L.C. / Clark, D. / Ramsay, E.P. et al. | British Library Online Contents | 2013

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Martin, L.C. / Clark, D. / Ramsay, E.P. et al. | British Library Online Contents | 2012

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Flexible Fullerene Field-Effect Transistors Fabricated Through Solution Processing

Sung, C. F. / Kekuda, D. / Chu, L. F. et al. | British Library Online Contents | 2009

Correction: Flexible Fullerene Field Effect Transistors Fabricated Through Solution Processing

Sung, C. F. / Kekuda, D. / Chu, L. F. et al. | British Library Online Contents | 2010

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