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Raman characterization and stress analysis of AlN:Er^3^+ epilayers grown on sapphire and silicon substrates
Raman characterization and stress analysis of AlN:Er^3^+ epilayers grown on sapphire and silicon substrates
Raman characterization and stress analysis of AlN:Er^3^+ epilayers grown on sapphire and silicon substrates
Kallel, T. (Autor:in) / Dammak, M. (Autor:in) / Wang, J. (Autor:in) / Jadwisienczak, W. M. (Autor:in)
01.01.2014
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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