Identification of Crystal Structure and Crystallographic Features of NiMnGa Thin Films by Combination of X-Ray Diffraction (XRD) and Electron Backscatter Diffraction (EBSD): Fid-Bau Portal

Identification of Crystal Structure and Crystallographic Features of NiMnGa Thin Films by Combination of X-Ray Diffraction (XRD) and Electron Backscatter Diffraction (EBSD)

Yang, B. / Li, Z.B. / Zhang, Y.D. / Esling, C. / Qin, G.W. / Zhao, X. / Zuo, L.

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Identification of Crystal Structure and Crystallographic Features of NiMnGa Thin Films by Combination of X-Ray Diffraction (XRD) and Electron Backscatter Diffraction (EBSD)

Yang, B. / Li, Z.B. / Zhang, Y.D. / Esling, C. / Qin, G.W. / Zhao, X. / Zuo, L.

Identification of Crystal Structure and Crystallographic Features of NiMnGa Thin Films by Combination of X-Ray Diffraction (XRD) and Electron Backscatter Diffraction (EBSD)

Yang, B. / Li, Z.B. / Zhang, Y.D. / Esling, C. / Qin, G.W. / Zhao, X. / Zuo, L.

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Titel:

Identification of Crystal Structure and Crystallographic Features of NiMnGa Thin Films by Combination of X-Ray Diffraction (XRD) and Electron Backscatter Diffraction (EBSD)

Beteiligte:

Yang, B. (Autor:in) / Li, Z.B. (Autor:in) / Zhang, Y.D. (Autor:in) / Esling, C. (Autor:in) / Qin, G.W. (Autor:in) / Zhao, X. (Autor:in) / Zuo, L. (Autor:in)

Erschienen in:

MATERIALS SCIENCE FORUM ; 783/786 ; 2561-2566

Erscheinungsdatum:

01.01.2014

Format / Umfang:

6 pages

ISSN:

0255-5476

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.11

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