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Identification of Crystal Structure and Crystallographic Features of NiMnGa Thin Films by Combination of X-Ray Diffraction (XRD) and Electron Backscatter Diffraction (EBSD)
Identification of Crystal Structure and Crystallographic Features of NiMnGa Thin Films by Combination of X-Ray Diffraction (XRD) and Electron Backscatter Diffraction (EBSD)
Identification of Crystal Structure and Crystallographic Features of NiMnGa Thin Films by Combination of X-Ray Diffraction (XRD) and Electron Backscatter Diffraction (EBSD)
Yang, B. (author) / Li, Z.B. (author) / Zhang, Y.D. (author) / Esling, C. (author) / Qin, G.W. (author) / Zhao, X. (author) / Zuo, L. (author)
MATERIALS SCIENCE FORUM ; 783/786 ; 2561-2566
2014-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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