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Infrared Studies of VO~2 Defect in Electron Irradiated Czochralski Silicon
Infrared Studies of VO~2 Defect in Electron Irradiated Czochralski Silicon
Infrared Studies of VO~2 Defect in Electron Irradiated Czochralski Silicon
Cai, L.-l. (Autor:in) / Feng, C.-j. (Autor:in) / Chen, G.-f. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING -HANGZHOU- ; 32 ; 251-254
01.01.2014
4 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.11
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