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Solid-material-based coupling efficiency analyzed with time-of-flight secondary ion mass spectrometry
Solid-material-based coupling efficiency analyzed with time-of-flight secondary ion mass spectrometry
Solid-material-based coupling efficiency analyzed with time-of-flight secondary ion mass spectrometry
Muenster, B. (Autor:in) / Welle, A. (Autor:in) / Ridder, B. (Autor:in) / Althuon, D. (Autor:in) / Striffler, J. (Autor:in) / Foertsch, T. C. (Autor:in) / Hahn, L. (Autor:in) / Thelen, R. (Autor:in) / Stadler, V. (Autor:in) / Nesterov-Mueller, A. (Autor:in)
APPLIED SURFACE SCIENCE ; 360 ; 306-314
01.01.2016
9 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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