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Solid-material-based coupling efficiency analyzed with time-of-flight secondary ion mass spectrometry
Solid-material-based coupling efficiency analyzed with time-of-flight secondary ion mass spectrometry
Solid-material-based coupling efficiency analyzed with time-of-flight secondary ion mass spectrometry
Muenster, B. (author) / Welle, A. (author) / Ridder, B. (author) / Althuon, D. (author) / Striffler, J. (author) / Foertsch, T. C. (author) / Hahn, L. (author) / Thelen, R. (author) / Stadler, V. (author) / Nesterov-Mueller, A. (author)
APPLIED SURFACE SCIENCE ; 360 ; 306-314
2016-01-01
9 pages
Article (Journal)
English
DDC:
621.35
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