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Temperature-dependent microstructural evolution of Ti2AlN thin films deposited by reactive magnetron sputtering
Temperature-dependent microstructural evolution of Ti2AlN thin films deposited by reactive magnetron sputtering
Temperature-dependent microstructural evolution of Ti2AlN thin films deposited by reactive magnetron sputtering
Zhang, Z. (Autor:in) / Jin, H. (Autor:in) / Chai, J. (Autor:in) / Pan, J. (Autor:in) / Seng, H. L. (Autor:in) / Goh, G. T. (Autor:in) / Wong, L. M. (Autor:in) / Sullivan, M. B. (Autor:in) / Wang, S. J. (Autor:in)
APPLIED SURFACE SCIENCE ; 368 ; 88-96
01.01.2016
9 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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