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Quantification of germanium-induced suppression of interstitial injection during oxidation of silicon
Quantification of germanium-induced suppression of interstitial injection during oxidation of silicon
Quantification of germanium-induced suppression of interstitial injection during oxidation of silicon
Martin, T. P. (Autor:in) / Jones, K. S. (Autor:in) / Camillo-Castillo, R. A. (Autor:in) / Hatem, C. (Autor:in) / Xin, Y. (Autor:in) / Elliman, R. G. (Autor:in)
JOURNAL OF MATERIALS SCIENCE ; 52 ; 10387-10392
01.01.2017
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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