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Current–voltage and capacitance–voltage characteristics of Al Schottky contacts to strained Si-on-insulator in the wide temperature range
Current–voltage and capacitance–voltage characteristics of Al Schottky contacts to strained Si-on-insulator in the wide temperature range
Current–voltage and capacitance–voltage characteristics of Al Schottky contacts to strained Si-on-insulator in the wide temperature range
Jyothi, I. (Autor:in) / Janardhanam, V. (Autor:in) / Hong, Hyobong (Autor:in) / Choi, Chel-Jong (Autor:in)
Materials science in semiconductor processing ; 39 ; 390-399
01.01.2015
10 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.38152
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