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    Current–voltage and capacitance–voltage characteristics of Al Schottky contacts to strained Si-on-insulator in the wide temperature range

    New search for: Jyothi, I.
    New search for: Janardhanam, V.
    New search for: Hong, Hyobong
    New search for: Choi, Chel-Jong

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    Current–voltage and capacitance–voltage characteristics of Al Schottky contacts to strained Si-on-insulator in the wide temperature range

    New search for: Jyothi, I.
    New search for: Janardhanam, V.
    New search for: Hong, Hyobong
    New search for: Choi, Chel-Jong

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Current–voltage and capacitance–voltage characteristics of Al Schottky contacts to strained Si-on-insulator in the wide temperature range

    New search for: Jyothi, I.
    New search for: Janardhanam, V.
    New search for: Hong, Hyobong
    New search for: Choi, Chel-Jong

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Title:

    Current–voltage and capacitance–voltage characteristics of Al Schottky contacts to strained Si-on-insulator in the wide temperature range

    Contributors:

    Jyothi, I. (author) / Janardhanam, V. (author) / Hong, Hyobong (author) / Choi, Chel-Jong (author)

    Published in:

    Materials science in semiconductor processing ; 39 ; 390-399

    Publication date:

    2015-01-01

    Size:

    10 pages

    ISSN:

    1369-8001

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.38152

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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