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Reprint of: Electron channelling contrast imaging for III-nitride thin film structures
Reprint of: Electron channelling contrast imaging for III-nitride thin film structures
Reprint of: Electron channelling contrast imaging for III-nitride thin film structures
Naresh-Kumar, G. (Autor:in) / Thomson, D. (Autor:in) / Nouf-Allehiani, M. (Autor:in) / Bruckbauer, J. (Autor:in) / Edwards, P.R. (Autor:in) / Hourahine, B. (Autor:in) / Martin, R.W (Autor:in) / Trager-Cowan, C. (Autor:in)
Materials science in semiconductor processing ; 55 ; 19-25
01.01.2016
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.38152
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Reprint of: Electron channelling contrast imaging for III-nitride thin film structures
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