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Observation of stacking faults in a scanning electron microscope by electron channelling contrast imaging
Observation of stacking faults in a scanning electron microscope by electron channelling contrast imaging
Observation of stacking faults in a scanning electron microscope by electron channelling contrast imaging
Weidner, A. (Autor:in) / Glage, A. (Autor:in) / Sperling, L. (Autor:in) / Biermann, H. (Autor:in)
INTERNATIONAL JOURNAL OF MATERIALS RESEARCH ; 102 ; 3-5
01.01.2011
3 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
669.9
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