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Atomistic scale nanoscratching behavior of monocrystalline Cu influenced by water film in CMP process
Atomistic scale nanoscratching behavior of monocrystalline Cu influenced by water film in CMP process
Atomistic scale nanoscratching behavior of monocrystalline Cu influenced by water film in CMP process
Shi, Junqin (Autor:in) / Chen, Juan (Autor:in) / Fang, Liang (Autor:in) / Sun, Kun (Autor:in) / Sun, Jiapeng (Autor:in) / Han, Jing (Autor:in)
Applied surface science ; 435 ; 983-992
01.01.2018
10 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.44
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