Optical gradients in a-Si:H thin films detected using real-time spectroscopic ellipsometry with virtual interface analysis

Junda, Maxwell M. / Karki Gautam, Laxmi / Collins, Robert W. et al. | British Library Online Contents | 2018

Temperature dependence of Mn1.56Co0.96Ni0.48O4 thin films optical properties by spectroscopic ellipsometry

Ma, Chao / Wang, Hong Guang / Zhao, Peng Jun et al. | British Library Online Contents | 2014

Temperature dependence of Mn1.56Co0.96Ni0.48O4 thin films optical properties by spectroscopic ellipsometry

Ma, C. / Wang, H. G. / Zhao, P. J. et al. | British Library Online Contents | 2014

Analysis of interface layers by spectroscopic ellipsometry

Kim, T. J. / Yoon, J. J. / Kim, Y. D. et al. | British Library Online Contents | 2008

Thermally induced changes in thin gold films detected by polaritonic ellipsometry

Romanyuk, V. R. / Kondratenko, O. S. / Fursenko, O. V. et al. | British Library Online Contents | 2008