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    Optical gradients in a-Si:H thin films detected using real-time spectroscopic ellipsometry with virtual interface analysis

    New search for: Junda, Maxwell M.
    New search for: Karki Gautam, Laxmi
    New search for: Collins, Robert W.
    New search for: Podraza, Nikolas J.

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    Optical gradients in a-Si:H thin films detected using real-time spectroscopic ellipsometry with virtual interface analysis

    New search for: Junda, Maxwell M.
    New search for: Karki Gautam, Laxmi
    New search for: Collins, Robert W.
    New search for: Podraza, Nikolas J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Optical gradients in a-Si:H thin films detected using real-time spectroscopic ellipsometry with virtual interface analysis

    New search for: Junda, Maxwell M.
    New search for: Karki Gautam, Laxmi
    New search for: Collins, Robert W.
    New search for: Podraza, Nikolas J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Document information
    Title:

    Optical gradients in a-Si:H thin films detected using real-time spectroscopic ellipsometry with virtual interface analysis

    Contributors:

    Junda, Maxwell M. (author) / Karki Gautam, Laxmi (author) / Collins, Robert W. (author) / Podraza, Nikolas J. (author)

    Published in:

    Applied surface science ; 436 ; 779-784

    Publication date:

    2018-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.44

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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