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Effect of thermal misfit stress on steam-driven delamination in electronic packages
Effect of thermal misfit stress on steam-driven delamination in electronic packages
Effect of thermal misfit stress on steam-driven delamination in electronic packages
Zhang, Xian (Autor:in) / Meng, Haoran (Autor:in) / Wang, Hehui (Autor:in) / Guo, Fenglin (Autor:in)
Engineering fracture mechanics ; 194 ; 61-72
01.01.2018
12 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.112605
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