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In situ atomic layer nitridation on the top and down regions of the amorphous and crystalline high-K gate dielectrics
In situ atomic layer nitridation on the top and down regions of the amorphous and crystalline high-K gate dielectrics
In situ atomic layer nitridation on the top and down regions of the amorphous and crystalline high-K gate dielectrics
Tsai, Meng-Chen (Autor:in) / Lee, Min-Hung (Autor:in) / Kuo, Chin-Lung (Autor:in) / Lin, Hsin-Chih (Autor:in) / Chen, Miin-Jang (Autor:in)
Applied surface science ; 387 ; 274-279
01.01.2016
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.44
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