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Influence of stacking faults on the quality of GaN films grown on sapphire substrate using a sputtered AlN nucleation layer
Influence of stacking faults on the quality of GaN films grown on sapphire substrate using a sputtered AlN nucleation layer
Influence of stacking faults on the quality of GaN films grown on sapphire substrate using a sputtered AlN nucleation layer
Chen, Zhibin (Autor:in) / Zhang, Jincheng (Autor:in) / Xu, Shengrui (Autor:in) / Xue, Junshuai (Autor:in) / Jiang, Teng (Autor:in) / Hao, Yue (Autor:in)
Materials research bulletin ; 89 ; 193-196
01.01.2017
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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