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Influence of stacking faults on the quality of GaN films grown on sapphire substrate using a sputtered AlN nucleation layer
Influence of stacking faults on the quality of GaN films grown on sapphire substrate using a sputtered AlN nucleation layer
Influence of stacking faults on the quality of GaN films grown on sapphire substrate using a sputtered AlN nucleation layer
Chen, Zhibin (author) / Zhang, Jincheng (author) / Xu, Shengrui (author) / Xue, Junshuai (author) / Jiang, Teng (author) / Hao, Yue (author)
Materials research bulletin ; 89 ; 193-196
2017-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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