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Structural and electrical characterization of multilayer Al2O3/ZnO nanolaminates grown by atomic layer deposition
Structural and electrical characterization of multilayer Al2O3/ZnO nanolaminates grown by atomic layer deposition
Structural and electrical characterization of multilayer Al2O3/ZnO nanolaminates grown by atomic layer deposition
Martínez-Castelo, J.R. (Autor:in) / López, J. (Autor:in) / Domínguez, D. (Autor:in) / Murillo, E. (Autor:in) / Machorro, R. (Autor:in) / Borbón-Nuñez, H.A. (Autor:in) / Fernandez-Alvarez, I. (Autor:in) / Arias, A. (Autor:in) / Curiel, M. (Autor:in) / Nedev, N. (Autor:in)
Materials science in semiconductor processing ; 71 ; 290-295
01.01.2017
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.38152
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