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Electrical characterization of FIB processed metal layers for reliable conductive-AFM on ZnO microstructures
Electrical characterization of FIB processed metal layers for reliable conductive-AFM on ZnO microstructures
Electrical characterization of FIB processed metal layers for reliable conductive-AFM on ZnO microstructures
Pea, M. (Autor:in) / Maiolo, L. (Autor:in) / Giovine, E. (Autor:in) / Rinaldi, A. (Autor:in) / Araneo, R. (Autor:in) / Notargiacomo, A. (Autor:in)
Applied surface science ; 371 ; 83-90
01.01.2016
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.44
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