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Electrical characterization of FIB processed metal layers for reliable conductive-AFM on ZnO microstructures

Pea, M. / Maiolo, L. / Giovine, E. / Rinaldi, A. / Araneo, R. / Notargiacomo, A.

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Electrical characterization of FIB processed metal layers for reliable conductive-AFM on ZnO microstructures

Pea, M. / Maiolo, L. / Giovine, E. / Rinaldi, A. / Araneo, R. / Notargiacomo, A.

Electrical characterization of FIB processed metal layers for reliable conductive-AFM on ZnO microstructures

Pea, M. / Maiolo, L. / Giovine, E. / Rinaldi, A. / Araneo, R. / Notargiacomo, A.

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Check availability in my library

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Document information

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Document information

Title:

Electrical characterization of FIB processed metal layers for reliable conductive-AFM on ZnO microstructures

Contributors:

Pea, M. (author) / Maiolo, L. (author) / Giovine, E. (author) / Rinaldi, A. (author) / Araneo, R. (author) / Notargiacomo, A. (author)

Published in:

Applied surface science ; 371 ; 83-90

Publication date:

2016-01-01

Size:

8 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.44

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