Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Front and back side SIMS analysis of boron-doped delta-layer in diamond
Front and back side SIMS analysis of boron-doped delta-layer in diamond
Front and back side SIMS analysis of boron-doped delta-layer in diamond
Pinault-Thaury, M.-A. (Autor:in) / Jomard, F. (Autor:in) / Mer-Calfati, C. (Autor:in) / Tranchant, N. (Autor:in) / Pomorski, M. (Autor:in) / Bergonzo, P. (Autor:in) / Arnault, J.-C. (Autor:in)
Applied surface science ; 410 ; 464-469
01.01.2017
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.44
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Back side SIMS analysis of hafnium silicate
British Library Online Contents | 2006
|Simulation of oxide sputtering and SIMS depth profiling of delta-doped layer
British Library Online Contents | 2003
|Sharp interfaces for diamond delta-doping and SIMS profile modelling
British Library Online Contents | 2014
|SIMS study of depth profiles of delta-doped boron/silicon alternating layers by low-energy ion beams
British Library Online Contents | 2003
|Metal Contacts to Boron-Doped Diamond
British Library Online Contents | 2009
|