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Bipolar resistive switching properties of AlN films deposited by plasma-enhanced atomic layer deposition
Bipolar resistive switching properties of AlN films deposited by plasma-enhanced atomic layer deposition
Bipolar resistive switching properties of AlN films deposited by plasma-enhanced atomic layer deposition
Zhang, Jian (Autor:in) / Zhang, Qilong (Autor:in) / Yang, Hui (Autor:in) / Wu, Huayu (Autor:in) / Zhou, Juehui (Autor:in) / Hu, Liang (Autor:in)
Applied surface science ; 315 ; 110-115
01.01.2014
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.44
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