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Annealing effects on properties of Ga2O3 films deposited by plasma-enhanced atomic layer deposition
Annealing effects on properties of Ga2O3 films deposited by plasma-enhanced atomic layer deposition
Annealing effects on properties of Ga2O3 films deposited by plasma-enhanced atomic layer deposition
Shi, Fengfeng (Autor:in) / Han, Jun (Autor:in) / Xing, Yanhui (Autor:in) / Li, Junshuai (Autor:in) / Zhang, Li (Autor:in) / He, Tao (Autor:in) / Li, Tao (Autor:in) / Deng, Xuguang (Autor:in) / Zhang, Xiaodong (Autor:in) / Zhang, Baoshun (Autor:in)
MATERIALS LETTERS ; 237 ; 105-108
01.01.2019
4 pages
Aufsatz (Zeitschrift)
Unbekannt
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