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TiN-buffered substrates for photoelectrochemical measurements of oxynitride thin films
TiN-buffered substrates for photoelectrochemical measurements of oxynitride thin films
TiN-buffered substrates for photoelectrochemical measurements of oxynitride thin films
Pichler, Markus (Autor:in) / Pergolesi, Daniele (Autor:in) / Landsmann, Steve (Autor:in) / Chawla, Vipin (Autor:in) / Michler, Johann (Autor:in) / Döbeli, Max (Autor:in) / Wokaun, Alexander (Autor:in) / Lippert, Thomas (Autor:in)
Applied surface science ; 369 ; 67-75
01.01.2016
9 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.44
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TiN-buffered substrates for photoelectrochemical measurements of oxynitride thin films
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