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Representative volume element analysis for wafer-level warpage using Finite Element methods
Representative volume element analysis for wafer-level warpage using Finite Element methods
Representative volume element analysis for wafer-level warpage using Finite Element methods
Baek, Jong Won (Autor:in) / Yang, Woo Seok (Autor:in) / Hur, Min Jae (Autor:in) / Yun, Jin Chul (Autor:in) / Park, Seong Jin (Autor:in)
Materials science in semiconductor processing ; 91 ; 392-398
01.01.2019
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.38152
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