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    Representative volume element analysis for wafer-level warpage using Finite Element methods

    New search for: Baek, Jong Won
    New search for: Yang, Woo Seok
    New search for: Hur, Min Jae
    New search for: Yun, Jin Chul
    New search for: Park, Seong Jin

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    Representative volume element analysis for wafer-level warpage using Finite Element methods

    New search for: Baek, Jong Won
    New search for: Yang, Woo Seok
    New search for: Hur, Min Jae
    New search for: Yun, Jin Chul
    New search for: Park, Seong Jin

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Representative volume element analysis for wafer-level warpage using Finite Element methods

    New search for: Baek, Jong Won
    New search for: Yang, Woo Seok
    New search for: Hur, Min Jae
    New search for: Yun, Jin Chul
    New search for: Park, Seong Jin

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Representative volume element analysis for wafer-level warpage using Finite Element methods

    Contributors:

    Baek, Jong Won (author) / Yang, Woo Seok (author) / Hur, Min Jae (author) / Yun, Jin Chul (author) / Park, Seong Jin (author)

    Published in:

    Materials science in semiconductor processing ; 91 ; 392-398

    Publication date:

    2019-01-01

    Size:

    7 pages

    ISSN:

    1369-8001

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.38152

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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