Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
CERAMIC, PROBE-GUIDING PART, PROBE CARD AND SOCKET FOR INSPECTING PACKAGE
A ceramic containing, in mass %:Si3N4: 20.0 to 60.0%,ZrO2: 25.0 to 70.0%,at least one selected from SiC and AlN: 2.0 to 17.0%, where AlN is 10.0% or less,at least one selected from MgO, Y2O3, CeO2, CaO, HfO2, TiO2, Al2O3, SiO2, MoO3, CrO, CoO, ZnO, Ga2O3, Ta2O5, NiO and V2O5: 5.0 to 15.0%, wherein Fn calculated from the following equation (1) satisfies 0.02 to 0.40. This ceramic can be laser machined with high efficiency. Fn=SiC+3AlN/Si3N4+ZrO2
CERAMIC, PROBE-GUIDING PART, PROBE CARD AND SOCKET FOR INSPECTING PACKAGE
A ceramic containing, in mass %:Si3N4: 20.0 to 60.0%,ZrO2: 25.0 to 70.0%,at least one selected from SiC and AlN: 2.0 to 17.0%, where AlN is 10.0% or less,at least one selected from MgO, Y2O3, CeO2, CaO, HfO2, TiO2, Al2O3, SiO2, MoO3, CrO, CoO, ZnO, Ga2O3, Ta2O5, NiO and V2O5: 5.0 to 15.0%, wherein Fn calculated from the following equation (1) satisfies 0.02 to 0.40. This ceramic can be laser machined with high efficiency. Fn=SiC+3AlN/Si3N4+ZrO2
CERAMIC, PROBE-GUIDING PART, PROBE CARD AND SOCKET FOR INSPECTING PACKAGE
KERAMIK, SONDENFÜHRUNGSELEMENT, SONDENKARTE UND SOCKEL ZUR INSPEKTION EINES PAKETS
CÉRAMIQUE, PIÈCE DE GUIDAGE DE SONDE, CARTE SONDE ET DOUILLE D'INSPECTION D'EMBALLAGE
YAMAGISHI WATARU (Autor:in) / MORI KAZUMASA (Autor:in) / ETO SHUNICHI (Autor:in)
12.03.2025
Patent
Elektronische Ressource
Englisch
CERAMIC, PROBE-GUIDING PART, PROBE CARD AND SOCKET FOR INSPECTING PACKAGE
| Europäisches Patentamt | 2019
CERAMIC, PROBE-GUIDING PART, PROBE CARD AND SOCKET FOR INSPECTING PACKAGE
| Europäisches Patentamt | 2021
Ceramic, probe-guiding part, probe card and socket for inspecting package
| Europäisches Patentamt | 2020
CERAMIC, PROBE-GUIDING PART, PROBE CARD AND SOCKET FOR INSPECTING PACKAGE
| Europäisches Patentamt | 2021
Ceramic, probe guidance component, probe card, and package inspecting socket
| Europäisches Patentamt | 2020