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COPPER/CERAMIC JOINED BODY, AND INSULATED CIRCUIT BOARD
To provide a copper/ceramic joined body that can suppress the occurrence of crack in the ceramic member even when a severe thermal cycle is applied, and has excellent thermal cycle reliability.SOLUTION: Provided is a copper/ceramic joined body 10 which is formed by joining copper members 12 and 13 made of copper or a copper alloy, and a ceramic member 11 made of silicon nitride, and in which an active metal nitride layer 21 is formed on the ceramic member 11 side of the copper member 12, an area ratio of the active metal compound including Si and the active metal in a region of 10 μm from the active metal nitride layer 21 to the copper member 12 side is 10% or less, and a ratio PA/PB between an area ratio PA of the active metal compound in a peripheral region A of the copper member 12 and an area ratio PB of the active metal compound in a central region B of the copper member 12 is within the range of 0.7 or more to 1.4 or less.SELECTED DRAWING: Figure 2
【課題】厳しい冷熱サイクルを負荷した場合であっても、セラミックス部材における割れの発生を抑制でき、冷熱サイクル信頼性に優れた銅/セラミックス接合体を提供する。【解決手段】銅又は銅合金からなる銅部材12,13と、窒化ケイ素からなるセラミックス部材11とが接合されてなる銅/セラミックス接合体10であって、銅部材12のうちセラミックス部材11側には、活性金属窒化物層21が形成されており、活性金属窒化物層21から銅部材12側へ10μmの領域におけるSiと活性金属とを含む活性金属化合物の面積率が10%以下とされており、銅部材12の周縁部領域Aにおける前記活性金属化合物の面積率PAと銅部材12の中央部領域Bにおける前記活性金属化合物の面積率PBとの比PA/PBが、0.7以上1.4以下の範囲内とされている。【選択図】図2
COPPER/CERAMIC JOINED BODY, AND INSULATED CIRCUIT BOARD
To provide a copper/ceramic joined body that can suppress the occurrence of crack in the ceramic member even when a severe thermal cycle is applied, and has excellent thermal cycle reliability.SOLUTION: Provided is a copper/ceramic joined body 10 which is formed by joining copper members 12 and 13 made of copper or a copper alloy, and a ceramic member 11 made of silicon nitride, and in which an active metal nitride layer 21 is formed on the ceramic member 11 side of the copper member 12, an area ratio of the active metal compound including Si and the active metal in a region of 10 μm from the active metal nitride layer 21 to the copper member 12 side is 10% or less, and a ratio PA/PB between an area ratio PA of the active metal compound in a peripheral region A of the copper member 12 and an area ratio PB of the active metal compound in a central region B of the copper member 12 is within the range of 0.7 or more to 1.4 or less.SELECTED DRAWING: Figure 2
【課題】厳しい冷熱サイクルを負荷した場合であっても、セラミックス部材における割れの発生を抑制でき、冷熱サイクル信頼性に優れた銅/セラミックス接合体を提供する。【解決手段】銅又は銅合金からなる銅部材12,13と、窒化ケイ素からなるセラミックス部材11とが接合されてなる銅/セラミックス接合体10であって、銅部材12のうちセラミックス部材11側には、活性金属窒化物層21が形成されており、活性金属窒化物層21から銅部材12側へ10μmの領域におけるSiと活性金属とを含む活性金属化合物の面積率が10%以下とされており、銅部材12の周縁部領域Aにおける前記活性金属化合物の面積率PAと銅部材12の中央部領域Bにおける前記活性金属化合物の面積率PBとの比PA/PBが、0.7以上1.4以下の範囲内とされている。【選択図】図2
COPPER/CERAMIC JOINED BODY, AND INSULATED CIRCUIT BOARD
銅/セラミックス接合体、および、絶縁回路基板
TERASAKI NOBUYUKI (Autor:in)
26.01.2023
Patent
Elektronische Ressource
Japanisch
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