Scanning Tunneling Microscopy, Atomic Force Microscopy, and Related Techniques. (Reannouncement with New Availability Information): Fid-Bau Portal

Scanning Tunneling Microscopy, Atomic Force Microscopy, and Related Techniques. (Reannouncement with New Availability Information)

S. R. Snyder / H. S. White

Abstract

This manuscript reviews the literature concerning STM, AFM, and other scanned-probe microscopies from January 1 through December 15, 1991.

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Scanning Tunneling Microscopy, Atomic Force Microscopy, and Related Techniques. (Reannouncement with New Availability Information)

S. R. Snyder / H. S. White

Abstract

This manuscript reviews the literature concerning STM, AFM, and other scanned-probe microscopies from January 1 through December 15, 1991.

Scanning Tunneling Microscopy, Atomic Force Microscopy, and Related Techniques. (Reannouncement with New Availability Information)

S. R. Snyder / H. S. White

Abstract

This manuscript reviews the literature concerning STM, AFM, and other scanned-probe microscopies from January 1 through December 15, 1991.

Zugriff

Zugriff über TIB

Verfügbarkeit in meiner Bibliothek prüfen

Seitennavigation

Dokumentinformationen

Ähnliche Titel

Exportieren, teilen und zitieren

Dokumentinformationen

Titel:

Scanning Tunneling Microscopy, Atomic Force Microscopy, and Related Techniques. (Reannouncement with New Availability Information)

Beteiligte:

S. R. Snyder (Autor:in) / H. S. White (Autor:in)

Erscheinungsdatum:

1992

Format / Umfang:

21 pages

Medientyp:

Report

Format:

Keine Angabe

Sprache:

Englisch

Schlagwörter:

Physical & Theoretical Chemistry , Analytical Chemistry , Analytical chemistry , Scanning electron microscopes , Microscopy , Probes , Reprints , Laser beams , Fiber optics , Piezoelectric materials , Image processing , High resolution , Scanning tunneling microscopy , Atomic force microscopy

S. R. Snyder / H. S. White | NTIS | 1992

Atomic Force Microscopy/Scanning Tunneling Microscopy

Cohen, Samuel H. | TIBKAT | 1994

Scanning Tunneling Microscopy of Cubic Silicon Carbide Surfaces. (Reannouncement with New Availability Information)

C. S. Chang / N. J. Zheng / I. S. Tsong et al. | NTIS | 1990

Atomic Force Microscopy/Scanning Tunneling Microscopy 2

Cohen, Samuel H. | TIBKAT | 1997

Advances in atomic force microscopy and scanning tunneling microscopy

Albrecht, Thomas Robert | TIBKAT | 1989

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