Scanning Tunneling Microscopy, Atomic Force Microscopy, and Related Techniques. (Reannouncement with New Availability Information): Fid-Bau Portal

Scanning Tunneling Microscopy, Atomic Force Microscopy, and Related Techniques. (Reannouncement with New Availability Information)

S. R. Snyder / H. S. White

Abstract

This manuscript reviews the literature concerning STM, AFM, and other scanned-probe microscopies from January 1 through December 15, 1991.

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Scanning Tunneling Microscopy, Atomic Force Microscopy, and Related Techniques. (Reannouncement with New Availability Information)

S. R. Snyder / H. S. White

Abstract

This manuscript reviews the literature concerning STM, AFM, and other scanned-probe microscopies from January 1 through December 15, 1991.

Scanning Tunneling Microscopy, Atomic Force Microscopy, and Related Techniques. (Reannouncement with New Availability Information)

S. R. Snyder / H. S. White

Abstract

This manuscript reviews the literature concerning STM, AFM, and other scanned-probe microscopies from January 1 through December 15, 1991.

Access

Access via TIB

Check availability in my library

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

Scanning Tunneling Microscopy, Atomic Force Microscopy, and Related Techniques. (Reannouncement with New Availability Information)

Contributors:

S. R. Snyder (author) / H. S. White (author)

Publication date:

1992

Size:

21 pages

Type of media:

Report

Type of material:

No indication

Language:

English

Keywords:

Physical & Theoretical Chemistry , Analytical Chemistry , Analytical chemistry , Scanning electron microscopes , Microscopy , Probes , Reprints , Laser beams , Fiber optics , Piezoelectric materials , Image processing , High resolution , Scanning tunneling microscopy , Atomic force microscopy

S. R. Snyder / H. S. White | NTIS | 1992

Atomic Force Microscopy/Scanning Tunneling Microscopy

Cohen, Samuel H. | TIBKAT | 1994

Scanning Tunneling Microscopy of Cubic Silicon Carbide Surfaces. (Reannouncement with New Availability Information)

C. S. Chang / N. J. Zheng / I. S. Tsong et al. | NTIS | 1990

Atomic Force Microscopy/Scanning Tunneling Microscopy 2

Cohen, Samuel H. | TIBKAT | 1997

Advances in atomic force microscopy and scanning tunneling microscopy

Albrecht, Thomas Robert | TIBKAT | 1989