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Computer Simulation Study on the Impurity Segregation at Extended Lattice Defects in Semiconductors
Computer Simulation Study on the Impurity Segregation at Extended Lattice Defects in Semiconductors
Computer Simulation Study on the Impurity Segregation at Extended Lattice Defects in Semiconductors
Masuda-Jindo, K. (author) / Yamamoto, R. (author) / Doyama, M.
2nd International conference on computer applications to materials and molecular science and engineering, Computer aided innovation of new materials ; 1992 ; Yokohama; Japan
1993-01-01
4 pages
In 2 pts. Also known as CAMSE 92
Conference paper
English
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