Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Synchrotron white beam x-ray topography characterization of structural defects in microgravity and ground-based CdZnTe crystals [2809-06]

    New search for: Chung, H.
    New search for: Raghothamachar, B.
    New search for: Dudley, M.
    New search for: Larson, D. J.
    New search for: Ramachandran, N.
    New search for: SPIE

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Synchrotron white beam x-ray topography characterization of structural defects in microgravity and ground-based CdZnTe crystals [2809-06]

    New search for: Chung, H.
    New search for: Raghothamachar, B.
    New search for: Dudley, M.
    New search for: Larson, D. J.
    New search for: Ramachandran, N.
    New search for: SPIE

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Synchrotron white beam x-ray topography characterization of structural defects in microgravity and ground-based CdZnTe crystals [2809-06]

    New search for: Chung, H.
    New search for: Raghothamachar, B.
    New search for: Dudley, M.
    New search for: Larson, D. J.
    New search for: Ramachandran, N.
    New search for: SPIE

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Synchrotron white beam x-ray topography characterization of structural defects in microgravity and ground-based CdZnTe crystals [2809-06]

    Contributors:

    Chung, H. (author) / Raghothamachar, B. (author) / Dudley, M. (author) / Larson, D. J. (author) / Ramachandran, N. / SPIE

    Conference:

    Conference, Space processing of materials ; 1996 ; Denver; CO

    Published in:

    Space processing of materials ; 45-56

    PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING

    Publication date:

    1996-01-01

    Size:

    12 pages

    ISBN:

    0819421979

    ISSN:

    0361-0748

    Type of media:

    Conference paper

    Type of material:

    Print

    Language:

    English

    Keywords:

    SPIE , space processing , materials

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    STABLE microgravity isolation flight demonstration [2809-45]

    Edberg, D. L. / Nurre, G. S. / SPIE | British Library Conference Proceedings | 1996

    MSG: microgravity science glovebox [2809-46]

    Baugher, C. R. / Ramachandran, N. / Roark, W. et al. | British Library Conference Proceedings | 1996

    Synchrotron White Beam Topography Studies of 2H SiC Crystals

    Dudley, M. / Huang, W. / Vetter, W. M. et al. | British Library Online Contents | 2000

    Effects of microgravity on ZBLAN optical fibers utilizing a sounding rocket [2809-04]

    Tucker, D. S. / Smith, G. A. / Workman, G. L. et al. | British Library Conference Proceedings | 1996

    Characterization of SiC Using Synchrotron White Beam X-Ray Topography

    Dudley, M. / Huang, X. | British Library Online Contents | 2000

    Back to top