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    Synchrotron White Beam Topography Studies of 2H SiC Crystals

    New search for: Dudley, M.
    New search for: Huang, W.
    New search for: Vetter, W. M.
    New search for: Neudeck, P.
    New search for: Powell, J. A.

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    Synchrotron White Beam Topography Studies of 2H SiC Crystals

    New search for: Dudley, M.
    New search for: Huang, W.
    New search for: Vetter, W. M.
    New search for: Neudeck, P.
    New search for: Powell, J. A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Synchrotron White Beam Topography Studies of 2H SiC Crystals

    New search for: Dudley, M.
    New search for: Huang, W.
    New search for: Vetter, W. M.
    New search for: Neudeck, P.
    New search for: Powell, J. A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Synchrotron White Beam Topography Studies of 2H SiC Crystals

    Contributors:

    Dudley, M. (author) / Huang, W. (author) / Vetter, W. M. (author) / Neudeck, P. (author) / Powell, J. A. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 338/342 ; 465-468

    Publication date:

    2000-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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