Synchrotron White Beam Topography Studies of 2H SiC Crystals

Dudley, M. / Huang, W. / Vetter, W. M. et al. | British Library Online Contents | 2000

Synchrotron white beam x-ray topography characterization of structural defects in microgravity and ground-based CdZnTe crystals [2809-06]

Chung, H. / Raghothamachar, B. / Dudley, M. et al. | British Library Conference Proceedings | 1996

Synchrotron topography characterization of ZnTe single crystals

Zhou, W. / Dudley, M. / Wu, J. et al. | British Library Online Contents | 1994

Synchrotron White Beam X-Ray Topography and Atomic Force Microscopy Studies of a 540R-SiC Lely Platelet

Vetter, W. M. / Dudley, M. / Huang, W. et al. | British Library Online Contents | 2000

Investigation of Semiconductor Heterostructures by White Beam Synchrotron X-Ray Topography in Grazing Bragg-Laue and Conventional Bragg Geometries

Yao, G.-D. / Wu, J. / Fanning, T. et al. | British Library Online Contents | 1993