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    Forensic applications of ion-beam mixing and surface spectroscopy of latent fingerprints (Invited Paper) [4468-09]

    New search for: Koch, C. H.
    New search for: Augustine, M. R.
    New search for: Marcus, H. L.
    New search for: Knystautas, E. J.
    New search for: Kirk, W. P.
    New search for: Browning, V.

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    Forensic applications of ion-beam mixing and surface spectroscopy of latent fingerprints (Invited Paper) [4468-09]

    New search for: Koch, C. H.
    New search for: Augustine, M. R.
    New search for: Marcus, H. L.
    New search for: Knystautas, E. J.
    New search for: Kirk, W. P.
    New search for: Browning, V.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Forensic applications of ion-beam mixing and surface spectroscopy of latent fingerprints (Invited Paper) [4468-09]

    New search for: Koch, C. H.
    New search for: Augustine, M. R.
    New search for: Marcus, H. L.
    New search for: Knystautas, E. J.
    New search for: Kirk, W. P.
    New search for: Browning, V.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Title:

    Forensic applications of ion-beam mixing and surface spectroscopy of latent fingerprints (Invited Paper) [4468-09]

    Contributors:

    Koch, C. H. (author) / Augustine, M. R. (author) / Marcus, H. L. (author) / Knystautas, E. J. / Kirk, W. P. / Browning, V. / International Society for Optical Engineering

    Conference:

    Conference, Engineering thin films with ion beams, nanoscale diagnostics, and molecular manufacturing ; 2001 ; San Diego, CA

    Published in:

    Engineering thin films with ion beams, nanoscale diagnostics, and molecular manufacturing ; 65-77

    PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 4468

    Publication date:

    2001-01-01

    Size:

    13 pages

    ISBN:

    0819441821

    ISSN:

    0277-786X

    Type of media:

    Conference paper

    Type of material:

    Print

    Language:

    English

    Keywords:

    thin films , ion beams , nanoscale diagnostics , molecular manufacturing , SPIE

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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