Epitaxial growth of ultrathin films of bismuth: an atomic force microscopy study: Fid-Bau Portal

Epitaxial growth of ultrathin films of bismuth: an atomic force microscopy study

Jing, J. / Henriksen, P. N. / Chu, H. T. / Wang, H.

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Epitaxial growth of ultrathin films of bismuth: an atomic force microscopy study

Jing, J. / Henriksen, P. N. / Chu, H. T. / Wang, H.

Epitaxial growth of ultrathin films of bismuth: an atomic force microscopy study

Jing, J. / Henriksen, P. N. / Chu, H. T. / Wang, H.

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Order at Subito €

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Document information

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Document information

Title:

Epitaxial growth of ultrathin films of bismuth: an atomic force microscopy study

Contributors:

Jing, J. (author) / Henriksen, P. N. (author) / Chu, H. T. (author) / Wang, H. (author)

Published in:

APPLIED SURFACE SCIENCE ; 62 ; 105

Publication date:

1992-01-01

Size:

105 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 621.35

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