Electrical characterization of grain boundaries of CZTS thin films using conductive atomic force microscopy techniques

Muhunthan, N. / Singh, Om Pal / Toutam, Vijaykumar et al. | British Library Online Contents | 2015

Atomic force microscopy study of small-size nanotubular polymer thin films

Zhu, C. F. / Lee, I. / Li, J. W. et al. | British Library Online Contents | 1999

Nano-oxidation of vanadium thin films using atomic force microscopy

Vaccaro, P. O. / Sakata, S. / Yamaoka, S. et al. | British Library Online Contents | 1998

Epitaxial growth of ultrathin films of bismuth: an atomic force microscopy study

Jing, J. / Henriksen, P. N. / Chu, H. T. et al. | British Library Online Contents | 1992

Scanning tunneling microscopy and atomic force microscopy investigation of organic tetracyanoquinodimethane thin films

Gao, H. J. / Zhang, H. X. / Xue, Z. Q. et al. | British Library Online Contents | 1997