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Conducting atomic force microscopy studies on local electrical properties of ultrathin SiO2 films
Conducting atomic force microscopy studies on local electrical properties of ultrathin SiO2 films
Conducting atomic force microscopy studies on local electrical properties of ultrathin SiO2 films
Ando, A. (author) / Hasunuma, R. (author) / Maeda, T. (author) / Sakamoto, K. (author) / Miki, K. (author) / Nishioka, Y. (author) / Sakamoto, T. (author)
APPLIED SURFACE SCIENCE ; 162/163 ; 401-405
2000-01-01
5 pages
Article (Journal)
English
DDC:
621.35
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