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TEM characterization of the GaP/Si interface grown by MOCVD
TEM characterization of the GaP/Si interface grown by MOCVD
TEM characterization of the GaP/Si interface grown by MOCVD
Soga, T. (author) / Jiang, Z. K. (author) / Suzuki, T. (author) / Jimbo, T. (author)
APPLIED SURFACE SCIENCE ; 60 ; 380
1992-01-01
380 pages
Article (Journal)
Unknown
DDC:
621.35
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