Process monitoring of semiconductor thin films and interfaces by spectroellipsometry

Brenot, R. / Drevillon, B. / Bulkin, P. et al. | British Library Online Contents | 2000

In situ spectroellipsometry study of the crosslinking of polypropylene by an argon plasma

Vallon, S. / Drevillon, B. / Poncin-Epaillard, F. | British Library Online Contents | 1997

Determination of optical properties of amorphous and crystalline thin films by spectroellipsometry

Yamaguchi, T. / Jayatissa, A. H. / Aoyama, M. et al. | British Library Online Contents | 1997

Dynamic Studies of Semiconductor Growth Processes Using In Situ Electron Microscopy 2000 MRS Spring Meeting Outstanding Young Investigator Presentation

Ross, F. M. | British Library Online Contents | 2001

In situ electrochemical AFM, ex situ IR reflection–absorption and confocal Raman studies of corrosion processes of AA 2024-T3

Kreta, Ahmed / Rodošek, Mirjana / Slemenik Perše, Lidija et al. | British Library Online Contents | 2016