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    Growth mode of ultrathin Sb layers on Si studied by spectroscopic ellipsometry and Raman scattering

    New search for: Rossow, U.
    New search for: Frotscher, U.
    New search for: Esser, N.
    New search for: Resch, U.

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    Growth mode of ultrathin Sb layers on Si studied by spectroscopic ellipsometry and Raman scattering

    New search for: Rossow, U.
    New search for: Frotscher, U.
    New search for: Esser, N.
    New search for: Resch, U.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Growth mode of ultrathin Sb layers on Si studied by spectroscopic ellipsometry and Raman scattering

    New search for: Rossow, U.
    New search for: Frotscher, U.
    New search for: Esser, N.
    New search for: Resch, U.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Growth mode of ultrathin Sb layers on Si studied by spectroscopic ellipsometry and Raman scattering

    Contributors:

    Rossow, U. (author) / Frotscher, U. (author) / Esser, N. (author) / Resch, U. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 63 ; 35

    Publication date:

    1993-01-01

    Size:

    35 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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