Minority carrier lifetime and metallic-impurity mapping in silicon wafers

Palais, O. / Martinuzzi, S. / Simon, J. J. | British Library Online Contents | 2001

Mapping of minority carrier lifetime and mobility in imperfect silicon wafers

Palais, O. / Clerc, L. / Arcari, A. et al. | British Library Online Contents | 2003

Minority carrier lifetime scan maps applied to iron concentration mapping in silicon wafers

Palais, O. / Yakimov, E. / Martinuzzi, S. | British Library Online Contents | 2002

Evaluation of the minority carrier lifetime and diffusion coefficient of cast polycrystalline silicon wafers by the dual mercury probe method

Suzuki, E. / Hayashi, Y. | British Library Online Contents | 1993

A study on the minority carrier diffusion length in n-type GaN films

Deng, D. / Zhao, D. / Wang, J. et al. | British Library Online Contents | 2007